Statistics for DFT+U investigation of electronic, optical, and thermoelectric properties of YAuX (X=Si or Ge or Sn) half-Heusler alloys
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| DFT+U investigation of electronic, optical, and thermoelectric properties of YAuX (X=Si or Ge or Sn) half-Heusler alloys | 2 |
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| DFT+ U investigation of electronic, optical_compressed.pdf | 10 |